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  • Our group studies various functionalities of oxide thin films (such as ferroelectricity, flexoelectricity, electronic/ionic transport, and so forth) mainly using scanning probe microscopy (SPM). SPM is a very powerful tool for nanoscale study, as described in the below figure.

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  • In particular, we are very interested in electromechanical response, including ferroelectricity, flexoelectricity, piezoelectricity, and electrochemical strain of oxide thin films. We have extensively investigated ferroelectric thin films, such as BaTiO3, Pb(Zr,Ti)O3, BiFeO3, and HfO2-based films. Using various SPM techniques (mainly, piezoresponse force microscopy (PFM)), we have studied ferroelectricity and related domain properties. We are also interested new SPM methods to study ferroelectricity, including band excitation PFM and contact-Kelvin probe force microscopy (cKPFM).  

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  • We are also very interested in nanoscale electronic and/or ionic transport of oxide thin films. We have investigated ferroelectric thin films, solid oxide fuel cell (SOFC) materials (e.g., Sm:CeO2-SrTiO3 vertical heterostructures) and metal-insulator transition (MIT) materials (e.g., VO2). Using various SPM techniques (mainly, conductive-atomic force microscopy (cAFM)), we have studied local conduction behaviors and their underlying mechanisms.  

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